Tom Bartenstein

Lecturer / Professor Department of Computer Science State University of New York at Binghamton Email: tbartens@binghamton.edu Library of "How to" items

^*Was CS-140, renamed to CS-210 Fall semester of 2023.

Current Research

Stream Programming Data Rates

Using Types to describe data processing rates in Stream Programming, with applications in energy usage, and saving energy using DVFS, as well as performance tuning.

Publications

• Rate Types for Stream Programs Thomas W. Bartenstein - PhD Dissertation, 2017 (available as open access.)
• Rate Types for Stream Programs Thomas W. Bartenstein and Yu David Liu,OOPSLA 2014 Powerpoint Slides On-line video of Presentation
• Green Streams for Data-Intensive SoftwareThomas W. Bartenstein and Yu David Liu, Processedings of the International Conference on Software Engineering (ICSE) 2013
• Method and System for Subnet Defect Diagnostics through Fault Compositing Thomas Webster Bartenstein, Joseph Michael Swenton; U.S. Patent Application No: 2012/0089872
• Method and System for Identifying Power Defects using Test Pattern Siwtching Activity Thomas Webster Bartenstein, Patrick Wayne Gallaher; U.S. Patent Application No: 2012/0089879
• Optimizng Test Data Volume Using Hybrid Compression, Brion Keller, Sandeep Bhatia, Thomas Bartenstein, Brian Foutz, Anis Uzzaman; Proceedings IEEE Asian Test Symposium, 2008
• Use of MISRs for compression and diagnostics Brion L. Keller, Thomas Bartenstein; Proceedings IEEE International Test Conference, 2005
• Panel 9 - DIagnostics vs. Failure Analysis Thomas W. Bartenstein; Proceedings International Test Conference, 2004
• An Economic Analysis and ROI Model for Nanometer Test Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane; Proceedings IEEE International Test Conference 2004.
• Diagnosing Combinatorial Logic Designs using the Single Location At-a-Time (SLAT) ParadigmThomas Bartenstein, Douglas Heaberlin, Leendert M. Huisman, David Sliwinski; Proceedings of the IEEE International Test Conference, 2001
• Fault Distinguishing Test Pattern Generation, Thomas Bartenstein; Proceedings of the IEEE International Test Conference, 2000
• Fault Model Extension for Diagnosing Custom Cell Fails Gilbert Vandling and Thomas Bartenstein, Proceedings of the IEEE International Test Conference, 1997.

Patents

• 6708306 - Method for diagnosing failures using invariant analysis
• 6721914 - Diagnosis of combinatorial logic circuit failures (Won IBM award for being among IBM's most highly licensed pattents)
• 6675323 - Incremental Fault Dictionary
• 6901542 - Internal cache for on chip test data storage
• 7496816 - Isolating the location of defects in scan chains
• 8190953 - Method and system for selecting test vectors in statistical volume diagnosis using failed test data
• 7821276 - Method and artical of manufacture to generate IC test vector for synchronized physical probing
• 8120378 - System to control insertion of care-bits in a an IC test vector improved optical probing

Industry Experience

• 1979-2001 Programmer/Architect working on printed circuit board release to manufacturing, and chip test generation and diagnostics at IBM.
• 2001-2010 Senior Architect working on chip test generation and diagnostics at Cadence. Awarded Cadence "Innovator of the Year" award in 2010.